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Dates:
08.09 - 10.09.2010
Venue:
Texel, The Netherlands
Report - PAGES: 
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Over the last decade, X-ray fluorescence (XRF) core scanning has become an established method for non-destructive and fast acquisition of sediment compositions (i.e., element count rates) directly at the surface of split cores. State-of-the-art core scanners can measure element intensities at sub-millimeter resolution that allow detailed recording of compositional variations in finely laminated and even varved sediments. Core-scanning data are widely applied to paleoceanographic and paleoclimate reconstructions on timescales ranging from seasonal to millions of years. New developments in data processing and calibration techniques have increased the need to exchange experiences among users at various laboratories equipped with an XRF core-scanner. Therefore, a three-day workshop was held at the Royal Netherlands Institute for Sea Research to discuss technical aspects and application challenges of XRF core scanning, in particular Avaatech scanners, in the wider field of paleoceanography.